BS PD ISO/TS 11888:2017

BS PD ISO/TS 11888:2017

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BS PD ISO/TS 11888:2017 describes methods for the characterization of mesoscopic shape factors of multiwallcarbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy (SEM),transmission electron microscopy (TEM), viscometry, and light scattering analysis.

This document also includes additional terms needed to define the characterization of static bendingpersistence length (SBPL). Measurement methods are given for the evaluation of SBPL, which generallyvaries from several tens of nanometres to several hundred micrometres.

Well-established concepts and mathematical expressions, analogous to polymer physics, are utilizedfor the definition of mesoscopic shape factors of MWCNTs.

Cross References:
ISO 9276-6:2008 Ed 1
ISO/TR 12885:2008 Ed 1
ISO/TS 80004-3:2010

All current amendments available at time of purchase are included with the purchase of this document.

Product Details

Published:
09/25/2017
ISBN(s):
9780580924385
Number of Pages:
26
File Size:
1 file , 2.5 MB
Same As:
ISO/TS 11888:2017
Product Code(s):
30333675, 30333675, 30333675