IEC 63068-2 Ed. 1.0 en:2019

Posted on: 09/12/202012/20/2019
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IEC 63068-2:2019(E) provides definitions and guidance in use of optical inspection for detecting as-grown defects in commercially available 4H-SiC (Silicon Carbide) epitaxial wafers. Additionally, this document exemplifies optical images to enable the detection and categorization of the defects for SiC homoepitaxial wafers. This document deals with a non-destructive test method for the defects so that destructive methods such as preferential etching are out of scope in this document.

Product Details

Edition:: 1.0
Published:: 01/30/2019
Number of Pages:: 25
File Size:: 1 file , 3 MB

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